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FIDES guide 2009 ) Q, m- A: ?) ^ G, t2 V7 C( w
May 2009 . F. M4 V# j6 F1 r9 i' L& \, S
Reliability Methodology for Electronic Systems" \: z$ I4 D0 \& y5 T4 c
. i( |/ ~$ W. r7 ?+ o" N. ]
Introduction1 L" ? {. e* g7 \1 r
The FIDES global electronic reliability engineering methodology Guide, is composed of; ^# D& I [' {3 O( N/ D
two parts:
( ~+ O7 [2 i9 E/ q4 R V+ L• a predicted reliability evaluation guide, C2 k7 r+ m0 A& E
• a reliability process control and audit guide.
7 e" ?' w' y# `4 OThe objectives of the FIDES Guide are firstly to make a realistic evaluation of the7 Z1 E* u& l5 f" i- D
reliability of electronic products, including in systems that encounter severe or nonaggressive" O! x9 v5 x# m L0 P9 O
environments (storage), and secondly to provide a specific tool for the
6 A4 e; Z6 A& n$ lconstruction and control of this reliability.
5 g5 X1 t# A: p/ e# c( fIts main characteristics are:1 s& ~- q* r; O. t- [5 t+ |, C
• The existence of models both for Electrical Electronic and Electromagnetic
# J. _( D4 C: Z6 t6 ncomponents, and for electronic boards or some subassemblies.8 K1 @0 E( f2 Q- m/ T2 b3 u9 p
• Demonstration and taking account of all technological and physical factors that
; {% S: Z, b# r3 p0 J0 Z5 Bhave an identified role in reliability.0 ~" W$ T. ] Y: h) r& Z9 H, i; E
• Precisely taking account of the life profile.- _% k8 S+ [: H6 p
• Taking account of electrical, mechanical and thermal overstresses.
9 x7 y; ]+ s2 ~+ n- x i+ s* L• Taking account of failures related to the development, production, operation and
% g1 d% A2 j. x: r( C6 \maintenance processes.3 f. H5 s" h8 f3 [
• The possibility of making a distinction between several suppliers of a single
) x* M, c- \- ocomponent.
5 d2 l$ }" D" f4 t6 a* A, g- p) AThe FIDES Guide can be helpful for taking action on definitions and throughout the life2 u" O) J- z6 i- P, n$ ?
cycle of products to improve and control reliability, through the identification of: }; P! b$ ?8 V, A5 @% I9 A0 e; Z+ Q
technological, physical or process factors contributing to reliability. |
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