08新书Transmission ElectronMicroscopy and Diffractometry of Materials

fenglianxiang

透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
* k$ s" T% i0 t/ d, ^5 n- v. u
& J! a4 N2 _' e7 N5 l% x作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
9 V5 o6 s4 e( [9 r2 }" m. o- sISSN:1439-2674
" L( J: [9 u3 G" B# XISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
出版商：Springer
7 C/ f' m8 k; R6 P, H7 r! o+ G* M年代：2008
Preface：
Experimental methods for diffraction and microscopy are pushing the front
) B. I9 S! V- p) K" r; uedge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
  `3 L  b; |: Q$ s8 R% Kregularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
, l1 x2 N8 m$ [, V0 s6 fhas been transformed from a dream of fifty years into experimentalmethods of today.
目录
' u3 x$ _, m6 A1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
& S0 [, h: W% j$ s1.1.2 Bragg’s Law ..................................... 3
& [1 o9 o) W2 e& z1.1.3 StrainE?ects.................................... 6
$ X1 {% @! g. w/ }- D, k; o# p7 o5 _1.1.4 SizeE?ects...................................... 7
1.1.5 ASymmetryConsideration ....................... 9
6 I2 a: p9 h. T! m& ~1.1.6 MomentumandEnergy ........................... 10
, N+ I  {& y! t9 @* F" M1.1.7 ExperimentalMethods............................ 10
1.2 TheCreationofX-Rays................................. 13
5 C$ l, Y- p5 G! P3 Y1.2.1 Bremsstrahlung.................................. 14
1.2.2 CharacteristicRadiation .......................... 16
. j5 @* `" O! p" p4 ]/ R1.2.3 SynchrotronRadiation............................ 20
! ?) L3 ]' y. E9 q1.3 TheX-RayPowderDi?ractometer........................ 23
1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
+ v# q8 U! z( i( v  a) q0 W1.4.3 ChargeSensitivePreamplifier...................... 36
1.4.4 OtherElectronics................................. 37
0 ?* P) o0 E, H# Q- U1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
( ^7 D+ w. V+ W4 o0 [1.5.2 PhaseFractionMeasurement ...................... 45
1.5.3 LatticeParameterMeasurement.................... 49
& `" S: k4 ~! N; V1 F6 M1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
9 ~  m3 K) [' H( [5 K' z7 LFurtherReading............................................ 54
; T# ?6 J' A" Y+ o/ NProblems .................................................. 55
2. The TEM and its Optics.................................. 61
2.1 Introduction to the Transmission Electron Microscope....... 61
2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
7 G( n0 f: ]( _.....................
共24个压缩卷，解压后45.5M

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