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FIDES guide 2009

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发表于 2009-6-9 09:21:43 | 显示全部楼层 |阅读模式 来自: 中国上海

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FIDES guide 2009
( L" W8 M/ j* e4 ?& r8 PMay 2009 . {- j) h6 d2 ]$ M& ]# j
Reliability Methodology for Electronic Systems6 Z! g6 _- F( f, l9 ~  M( ^
: B- |  K9 e- f, S" x0 \# D
Introduction& w8 s" D& D6 K6 r1 r  j3 o
The FIDES global electronic reliability engineering methodology Guide, is composed of% u) x, [% q6 Z) d/ q  K) [
two parts:( q& D4 e) F: J/ c  Z, Q
• a predicted reliability evaluation guide,$ P, L! V/ b7 P
• a reliability process control and audit guide.
2 ^/ l3 ^+ x) N* uThe objectives of the FIDES Guide are firstly to make a realistic evaluation of the" g8 ]9 d: d2 Y# f; E/ e, ~
reliability of electronic products, including in systems that encounter severe or nonaggressive
( c; E& S( ?* x/ [8 zenvironments (storage), and secondly to provide a specific tool for the
4 b& }* R* f' o- S0 z, e" bconstruction and control of this reliability.7 u; {/ P( e; B) U1 S+ I7 B3 S3 T
Its main characteristics are:
' W, o' w) ?( g) F5 |$ U/ X) ]" z• The existence of models both for Electrical Electronic and Electromagnetic
1 f. L/ ]% ~$ Y7 ?7 b3 _7 o' Dcomponents, and for electronic boards or some subassemblies.
0 g3 e: R$ `. C: w• Demonstration and taking account of all technological and physical factors that
) T" f! V* Z% B0 g  ~" Yhave an identified role in reliability.
: P+ Z+ ~- G& |& z• Precisely taking account of the life profile.
: E: W! K2 ^6 Z0 r7 Q• Taking account of electrical, mechanical and thermal overstresses.
, }$ y- Q; K2 e! B4 s0 W" y• Taking account of failures related to the development, production, operation and
& v" C6 J" F0 H: i$ Vmaintenance processes.% S5 a1 ?6 c' S5 ^7 z
• The possibility of making a distinction between several suppliers of a single4 }2 r4 k$ ^. o: F
component.$ ?! |2 q) }0 K1 h) L
The FIDES Guide can be helpful for taking action on definitions and throughout the life' S7 Z9 [' k& m2 N( z+ o* t7 m' h! U* {
cycle of products to improve and control reliability, through the identification of, O; H8 \2 x/ i' P5 y
technological, physical or process factors contributing to reliability.

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