08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
) @- F$ I* i; z+ F
0 {4 a! t" ^% \4 @8 |/ k  E作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
+ ?! N' n. }( w0 m' `' bISSN:1439-2674
4 z) T2 U7 f3 ?  u4 h* XISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
6 r/ t  e3 s  _# b8 U出版商：Springer
年代：2008
Preface：
Experimental methods for diffraction and microscopy are pushing the front
$ }0 Y3 R; s9 a' s8 Z  `: Sedge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
+ |" M0 X" M2 u. Hregularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
( g% v5 r0 r( l5 n& Z3 Y6 Xhas been transformed from a dream of fifty years into experimentalmethods of today.
1 F5 y" s8 Y( n5 \% f目录
1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
4 v/ k- B" l% G9 k, r1.1.1 IntroductiontoDi?raction ........................ 1
1.1.2 Bragg’s Law ..................................... 3
; q; @* m' X# b3 A+ D( Q1 Z1.1.3 StrainE?ects.................................... 6
: M! i* F. }; \5 \" o1.1.4 SizeE?ects...................................... 7
1.1.5 ASymmetryConsideration ....................... 9
( j5 E7 ^0 [( O" l2 ~$ g1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
1.2 TheCreationofX-Rays................................. 13
1.2.1 Bremsstrahlung.................................. 14
+ r6 q2 K0 c: J/ Z6 P9 H8 ^1.2.2 CharacteristicRadiation .......................... 16
5 \7 |9 s: j) A( S! q, y1.2.3 SynchrotronRadiation............................ 20
+ z$ L! V/ r9 O7 D2 U4 b5 B2 Z1.3 TheX-RayPowderDi?ractometer........................ 23
1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1 }4 V3 z- g# ?( c/ c; K4 [1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
+ f9 A6 M0 x! d4 V" Y; v1.4.3 ChargeSensitivePreamplifier...................... 36
$ X: K2 I% ~9 p; D1.4.4 OtherElectronics................................. 37
/ _% @) s; r! ~+ O1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
/ m4 P4 K% |  ^- B. A! w1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
1.5.2 PhaseFractionMeasurement ...................... 45
/ A8 h% ?  t3 Y/ D" X! e3 @/ g1.5.3 LatticeParameterMeasurement.................... 49
4 F; q. \& n+ Y1 x# h2 S0 t1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
Problems .................................................. 55
2. The TEM and its Optics.................................. 61
2.1 Introduction to the Transmission Electron Microscope....... 61
2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
7 C3 w5 J7 u' P* M- J. G2 V.....................
4 T# j+ X7 X0 d. J* z5 t# ^共24个压缩卷，解压后45.5M

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