08新书Transmission ElectronMicroscopy and Diffractometry of Materials

fenglianxiang

透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！

作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
& E$ i9 c$ t4 ?ISSN:1439-2674
ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
出版商：Springer
0 `$ a/ w$ @2 K年代：2008
; a8 u$ _* P( F* A* wPreface：
# a( ^: |2 L3 G% T  ~8 y2 `Experimental methods for diffraction and microscopy are pushing the front
edge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
regularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
# k9 s( ^& Y0 r5 w# j目录
1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
3 u  f) a0 E* b* Q8 A% n1.1.2 Bragg’s Law ..................................... 3
6 S! Y" D- \' o. ^. U1.1.3 StrainE?ects.................................... 6
( k3 n7 f; p2 X6 V8 s) e# ]1.1.4 SizeE?ects...................................... 7
1.1.5 ASymmetryConsideration ....................... 9
! I+ P1 G1 Z7 A1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
1.2 TheCreationofX-Rays................................. 13
6 ?# c. ~6 j# F9 ~2 M1.2.1 Bremsstrahlung.................................. 14
1 G# |1 G2 F2 G4 K: J5 a1.2.2 CharacteristicRadiation .......................... 16
  ]2 r/ t5 X$ i0 m4 O# d/ [1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
1.3.1 PracticeofX-RayGeneration...................... 23
: }0 a/ i& U, ]! ?1.3.2 GoniometerforPowderDi?raction ................. 25
2 ^) Z$ ]" @/ b/ @1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
8 z6 Y" k5 k% W5 X& ~3 K1.4.1 DetectorPrinciples ............................... 30
, k# x' s' F7 h: j8 L1.4.2 Position-SensitiveDetectors ....................... 34
1.4.3 ChargeSensitivePreamplifier...................... 36
1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
. p# X% V7 V1 v; J1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
1.5.2 PhaseFractionMeasurement ...................... 45
1.5.3 LatticeParameterMeasurement.................... 49
1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
Problems .................................................. 55
$ M& q2 i/ P, P  W) g- N: i2. The TEM and its Optics.................................. 61
7 r# Y& y) v2 R: x* M2.1 Introduction to the Transmission Electron Microscope....... 61
" c% e1 D( c$ o0 h! W2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
8 |; z5 X4 T, ^/ T4 B5 P2 X& @.....................
' K( {) j! v0 A$ D& I( K! y" T共24个压缩卷，解压后45.5M

& D0 Q  p$ j1 d% q$ u3 {6 e/ @[ 本帖最后由 fenglianxiang 于 2008-7-27 11:00 编辑 ]