08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！

作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
ISSN:1439-2674
- q8 c8 N" I% ~" T8 ?ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
. A: ~4 c* u% G1 H& M* N- m1 ~; b出版商：Springer
年代：2008
, @: r* T  b+ I. m2 K5 `$ TPreface：
Experimental methods for diffraction and microscopy are pushing the front
4 }) o% [3 M1 `0 M/ n& E( E( b+ C' |edge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
regularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
目录
9 ^$ B  K7 r; y9 }+ H$ E1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
8 x9 B3 O$ L& t/ P4 d1.1.1 IntroductiontoDi?raction ........................ 1
; e9 A5 n' Z5 c8 ^' D1.1.2 Bragg’s Law ..................................... 3
1.1.3 StrainE?ects.................................... 6
1.1.4 SizeE?ects...................................... 7
1.1.5 ASymmetryConsideration ....................... 9
  k' X% Q9 S7 x- e1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
" w; x2 R4 m$ o, e2 V1.2 TheCreationofX-Rays................................. 13
1.2.1 Bremsstrahlung.................................. 14
- U* E; b5 e  A, n& v) H, t$ A+ Y1.2.2 CharacteristicRadiation .......................... 16
  a* F! E% A9 z; M$ ~) R1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
+ L8 K2 h% v, v' F1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
1.4.3 ChargeSensitivePreamplifier...................... 36
1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
1.5.2 PhaseFractionMeasurement ...................... 45
6 w+ n2 ^3 M1 F8 a# B1.5.3 LatticeParameterMeasurement.................... 49
. R2 T# N; a# H$ ?9 p8 M, d1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
Problems .................................................. 55
2. The TEM and its Optics.................................. 61
2.1 Introduction to the Transmission Electron Microscope....... 61
- p# O1 @: \$ B7 Q8 e" k2.2 WorkingwithLensesandRayDiagrams................... 66
6 L% D& R; h% U- C) K7 c4 j" I) @, Q2.2.1 SingleLenses .................................... 66
; G0 q4 C- ^  v( ]7 T" J.....................
! @1 R. w9 k! N- z/ G5 |2 j共24个压缩卷，解压后45.5M

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