08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！

作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
ISSN:1439-2674
ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
+ _: V0 H/ |) y. u: q2 pISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
出版商：Springer
. X1 M  \3 Z" Z3 t; r年代：2008
Preface：
" Y- R/ m& e) ?. d5 lExperimental methods for diffraction and microscopy are pushing the front
6 a6 {8 ~  z! t" e* _. Pedge of nanoscience and materials science, and important new developments
+ _* R/ U6 V# I1 O! ?are covered in this third edition. For transmission electron microscopy, a remarkable
* g) v5 D% e" O; \+ `1 C+ N1 nrecent development has been a practical corrector for the spherical
' s( G+ A' ^# ~aberration of the objective lens. Image resolution below 1˚A can be achieved
6 }4 a* N' ^/ t6 [4 o8 D8 Zregularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
目录
$ |/ a8 C, s) ]$ d. h1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1 z/ Y5 w7 N7 w1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
, c6 c$ d6 I7 d8 j' m! T1.1.2 Bragg’s Law ..................................... 3
/ v% \2 \) X/ T7 I3 q* y1.1.3 StrainE?ects.................................... 6
1.1.4 SizeE?ects...................................... 7
3 ~7 ^# E2 ]$ T2 k' A1.1.5 ASymmetryConsideration ....................... 9
1.1.6 MomentumandEnergy ........................... 10
8 p- p3 U+ v1 B; X' R1.1.7 ExperimentalMethods............................ 10
1 r5 t/ f  S+ J! }) p/ k, J2 ~1.2 TheCreationofX-Rays................................. 13
+ f- K+ Y# W; m. p4 {. P7 \1.2.1 Bremsstrahlung.................................. 14
1.2.2 CharacteristicRadiation .......................... 16
: @. Z. O! f- m# y, d1.2.3 SynchrotronRadiation............................ 20
) \: A7 b! ~! @) o. j1.3 TheX-RayPowderDi?ractometer........................ 23
1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
0 t" ?" b9 X( |& O; d1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
1.4.1 DetectorPrinciples ............................... 30
0 E- W  s% A* ?5 ^4 y2 i. |: O" V2 R1.4.2 Position-SensitiveDetectors ....................... 34
1.4.3 ChargeSensitivePreamplifier...................... 36
1.4.4 OtherElectronics................................. 37
6 R1 N. ]. ~- @; N3 t) J2 l1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
$ g9 b$ t! `4 f& A1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
6 A. |8 x3 L* M3 ?1.5.2 PhaseFractionMeasurement ...................... 45
6 v9 g) P& t# u2 M9 `' Y1.5.3 LatticeParameterMeasurement.................... 49
5 {/ l/ Q$ S9 n+ ?6 W" y1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
2 B+ E& |' E( Y% }) DProblems .................................................. 55
* J* k1 s# e5 z# T2. The TEM and its Optics.................................. 61
6 E8 _" }& E6 w9 ?' x! r" E6 }- ]2.1 Introduction to the Transmission Electron Microscope....... 61
8 \* {% l% D$ U4 D$ m6 q2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
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共24个压缩卷，解压后45.5M

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