08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
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, K) q& T  U8 Q# N8 _& ?作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
ISSN:1439-2674
, L2 `2 [, B4 W7 GISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
  E7 x- x5 C3 uISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
出版商：Springer
7 y, @$ u% Z8 Q/ l. q1 ?年代：2008
Preface：
1 {$ o5 k- y3 B6 }. iExperimental methods for diffraction and microscopy are pushing the front
* P/ v/ p) J( P# Z6 cedge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
: n. L" c0 f2 I! K# Tregularly now, and the energy resolution of electron spectrometry has also
! e( G8 V  b# x/ p% Uimproved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
目录
1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
& A$ L  ]/ E4 o7 h: w' y1.1.1 IntroductiontoDi?raction ........................ 1
. F- G( X; @' x' z, X2 t7 f" s1.1.2 Bragg’s Law ..................................... 3
1.1.3 StrainE?ects.................................... 6
1 K) D1 t; |% Z# L1.1.4 SizeE?ects...................................... 7
1.1.5 ASymmetryConsideration ....................... 9
1.1.6 MomentumandEnergy ........................... 10
4 o0 D# l  Y  J( p/ a% E5 j1.1.7 ExperimentalMethods............................ 10
3 E& W! O4 n8 f. N0 h1.2 TheCreationofX-Rays................................. 13
1.2.1 Bremsstrahlung.................................. 14
2 z& q, {! L! F* P- z6 q1.2.2 CharacteristicRadiation .......................... 16
1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
0 P. x/ h% B' @; t- G2 l9 t  |1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
+ f! b0 U0 Y9 B/ P4 C1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
  o) Y) l5 s; ], d6 v5 j1.4.3 ChargeSensitivePreamplifier...................... 36
1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
/ C: W% C' s. @; ^; r/ _1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
- B- s5 m5 B5 C; T1 r& A1.5.2 PhaseFractionMeasurement ...................... 45
# \5 f7 C+ s) S6 \+ K% P3 e# T1.5.3 LatticeParameterMeasurement.................... 49
1 Q; h5 |1 C7 R3 t- J/ C1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
Problems .................................................. 55
/ b" K0 ^, Z4 F+ ?& R( y- L3 y) t2. The TEM and its Optics.................................. 61
2.1 Introduction to the Transmission Electron Microscope....... 61
2.2 WorkingwithLensesandRayDiagrams................... 66
) [; q6 C* X. M- h7 k! `- C* q# J2.2.1 SingleLenses .................................... 66
3 z% c& v/ p9 c5 t' D! b.....................
共24个压缩卷，解压后45.5M
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